DocumentCode :
3111053
Title :
Elimination of incoming test based upon in-process failure and repair costs
Author :
Ballew, W. David ; Streb, Lauren M.
Author_Institution :
AT&T, Oklahoma City, OK, USA
fYear :
1988
fDate :
12-14 Sep 1988
Firstpage :
308
Lastpage :
313
Abstract :
An economic model was developed that challenges traditional statistical quality-control methods in the factory. Incoming inspection levels can be determined as a function of both the PPM (parts per million) quality level and the lot-to-lot stability. When incoming quality levels fall to below 100 PPM, the model can be used to reevaluate conventional test strategies in high volume manufacturing operations. Process variability as measured by statistical process control methods can be monitored as lot stability and incoming inspection levels adjusted accordingly
Keywords :
economics; electronic equipment testing; inspection; production testing; quality control; statistical analysis; economic model; high volume manufacturing operations; in-process failure; incoming inspection; incoming test; lot stability; production testing; repair costs; statistical process control; Circuit testing; Cities and towns; Computer integrated manufacturing; Costs; Environmental economics; Manufacturing processes; Production facilities; Sampling methods; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-8186-0870-6
Type :
conf
DOI :
10.1109/TEST.1988.207816
Filename :
207816
Link To Document :
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