• DocumentCode
    3111053
  • Title

    Elimination of incoming test based upon in-process failure and repair costs

  • Author

    Ballew, W. David ; Streb, Lauren M.

  • Author_Institution
    AT&T, Oklahoma City, OK, USA
  • fYear
    1988
  • fDate
    12-14 Sep 1988
  • Firstpage
    308
  • Lastpage
    313
  • Abstract
    An economic model was developed that challenges traditional statistical quality-control methods in the factory. Incoming inspection levels can be determined as a function of both the PPM (parts per million) quality level and the lot-to-lot stability. When incoming quality levels fall to below 100 PPM, the model can be used to reevaluate conventional test strategies in high volume manufacturing operations. Process variability as measured by statistical process control methods can be monitored as lot stability and incoming inspection levels adjusted accordingly
  • Keywords
    economics; electronic equipment testing; inspection; production testing; quality control; statistical analysis; economic model; high volume manufacturing operations; in-process failure; incoming inspection; incoming test; lot stability; production testing; repair costs; statistical process control; Circuit testing; Cities and towns; Computer integrated manufacturing; Costs; Environmental economics; Manufacturing processes; Production facilities; Sampling methods; Switches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1988. Proceedings. New Frontiers in Testing, International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-0870-6
  • Type

    conf

  • DOI
    10.1109/TEST.1988.207816
  • Filename
    207816