Title :
On multiple fault coverage and aliasing probability measures
Author :
Cox, Henry ; Ivanov, André ; Agarwal, Vinod K. ; Rajski, Janusz
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
Abstract :
A comparative study is presented of different methods of calculating multiple fault coverage and aliasing probability measures. The objectives are to describe the ways that these ratios are defined to give them a physical interpretation, and to separate the discussion of how to define the measure from how the measure might be actually obtained or calculated. The interpretation, accuracy, and applicability of the measures are discussed
Keywords :
electronic equipment testing; fault location; integrated logic circuits; logic testing; probability; aliasing probability; electronic equipment testing; interpreted logic circuits; logic testing; multiple fault coverage; Circuit faults; Density measurement; Electric variables measurement; Electrical fault detection; Integrated circuit measurements; Integrated circuit modeling; Logic circuits; Probability; Semiconductor device measurement; Testing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207817
