DocumentCode
3111068
Title
On multiple fault coverage and aliasing probability measures
Author
Cox, Henry ; Ivanov, André ; Agarwal, Vinod K. ; Rajski, Janusz
Author_Institution
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fYear
1988
fDate
12-14 Sep 1988
Firstpage
314
Lastpage
321
Abstract
A comparative study is presented of different methods of calculating multiple fault coverage and aliasing probability measures. The objectives are to describe the ways that these ratios are defined to give them a physical interpretation, and to separate the discussion of how to define the measure from how the measure might be actually obtained or calculated. The interpretation, accuracy, and applicability of the measures are discussed
Keywords
electronic equipment testing; fault location; integrated logic circuits; logic testing; probability; aliasing probability; electronic equipment testing; interpreted logic circuits; logic testing; multiple fault coverage; Circuit faults; Density measurement; Electric variables measurement; Electrical fault detection; Integrated circuit measurements; Integrated circuit modeling; Logic circuits; Probability; Semiconductor device measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207817
Filename
207817
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