Title :
RCS reduction in planar, cylindrical, and spherical structures by composite coatings using genetic algorithms
Author :
Mosallaei, H. ; Rahmat-Samii, Y.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
Radar cross section (RCS) reduction of a target using multilayered radar absorbing materials (RAM) has been an important consideration in radar systems. The properties of the RAM depend on the frequency and for wide-band absorption, a proper composite selection of these materials is necessary. This paper focuses on the design of a wide-band multilayered RAM coating for planar, cylindrical, and spherical conducting structures such that the RCS is reduced considerably. The method is based on the genetic algorithm (GA) optimization technique integrated with the modal solution of Maxwell´s equations in a multilayered geometry. It is shown that by a proper design of materials and their thickness, the RCS is reduced significantly in a wide frequency bandwidth. Additionally, it is observed that the application of an optimized coating for planar structure can reduce the RCS of a cylindrical or spherical structure efficiently.
Keywords :
Maxwell equations; coatings; composite materials; electromagnetic wave absorption; genetic algorithms; modal analysis; radar cross-sections; Maxwell´s equations; RCS reduction; composite coatings; composite materials; conducting structures; cylindrical structure; genetic algorithms; material thickness; modal solution; multilayered geometry; multilayered radar absorbing materials; optimization technique; planar structure; radar cross section; radar systems; spherical structure; wide frequency bandwidth; wide-band absorption; wide-band multilayered RAM coating; Absorption; Coatings; Composite materials; Conducting materials; Frequency; Genetic algorithms; Maxwell equations; Optimization methods; Radar cross section; Wideband;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
DOI :
10.1109/APS.1999.789172