Reconfigurable hardware for pseudoexhaustive test

The designs of two test pattern generators for pseudoexhaustive testing have been presented. These designs are capable of implementing test sets (recipe cubes) that exhaustively test the segments of a circuit. The application of each test set requires two control bits per circuit input. The test-pattern generators can be reconfigured by simple control circuitry to apply each of the test sets of a pseudoexhaustive test in sequence. The first design, based on multiplexers, uses very little hardware. The second design is a reconfigurable counter. Both of the designs presented can be used with built-in self-test (BIST) and or scan-path testing. In addition to higher fault coverage than single stuck-at testing, the use of these designs can sometimes offer reduced on-chip storage requirements and reduced testing time