DocumentCode
3111339
Title
Nanotexturing of ceramic products surface by means of low-energy electron and laser exposure
Author
Savruk, Elena V. ; Smirnov, Seraphim V.
Author_Institution
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
fYear
2011
fDate
June 30 2011-July 4 2011
Firstpage
96
Lastpage
99
Abstract
Results of research of near-surface layer of aluminum oxide ceramics thin plates were presented. Layers were produced by treatment of electron beam (5 keV energy) - electron beam treatment (EBT) - and laser beam (1.06 um wavelength) exposure - laser treatment (LT). The composition and structure of near-surface layer were researched by methods of electron microscopy, X-ray structure analysis and IR Fourier spectroscopy. It was shown that in case of LT the chevron texture occurred as a result of ceramics melting with following recrystallization in 110 direction. In connection with this fact potentialities of directed alteration of surface texture appear. It can be performed by changing of laser beam power density and its scanning speed. Mechanical properties of modified layers were researched by method of microhardness indentation with use of Vickers diamond pyramid. It has been established that destruction viscosity factor increases up to 6% at the expense of compressing elastic stress occurrence due to processes of melting and crystallization.
Keywords
Fourier transform spectra; Vickers hardness; X-ray diffraction; alumina; ceramic products; ceramics; crystallisation; electron beam applications; indentation; infrared spectra; laser materials processing; melting; microhardness; nanostructured materials; plates (structures); recrystallisation; surface texture; surface treatment; viscosity; Al2O3; IR Fourier spectroscopy; Vickers diamond pyramid; X-ray structure analysis; aluminum oxide ceramic thin plate near-surface layer; ceramic product surface nanotexturing; ceramics melting; chevron texture; destruction viscosity factor; elastic stress occurrence compression; electron beam treatment; electron microscopy; laser beam exposure; laser beam power density; laser treatment; low-energy electron exposure; mechanical property; microhardness indentation method; near-surface layer structure; recrystallization; Aluminum oxide; Ceramics; Electron beams; Laser beams; Surface treatment; X-ray diffraction; α-phase Al2 O3 ; γ-phase Al2 O3 ; Surface nanotexturing; phase composition;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro/Nanotechnologies and Electron Devices (EDM), 2011 International Conference and Seminar of Young Specialists on
Conference_Location
Erlagol, Altai
Print_ISBN
978-1-61284-793-1
Type
conf
DOI
10.1109/EDM.2011.6006904
Filename
6006904
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