Title :
A high-resolution waveform analysis tool
Author :
Powers, Patrick M.
Author_Institution :
Megatest Corp., San Jose, CA, USA
Abstract :
A system is described for very-high-resolution measurement, statistical analysis, and graphical display of waveforms appearing on a VLSI device. Capabilities include superimposing graphs of waveforms resulting from differing test conditions or from different pins. Measurement is done by averaging the results of multiple trials. The measurement device has a resolution of 3 ps, accuracy of 100 ps, and is calibrated using the time-domain reflectometry technique. The system´s graphical interface is user-friendly. The author describes the hardware used for the measurements, the software optimization techniques used to obtain sufficient throughput to allow interactive display of waveforms, and the range of applications of the package
Keywords :
VLSI; automatic testing; computer aided analysis; integrated circuit testing; optimisation; software packages; statistical analysis; time-domain reflectometry; waveform analysis; IC testing; VLSI device; averaging; graphical display; graphical interface; multiple trials; software optimization; statistical analysis; time-domain reflectometry; waveform analysis tool; Displays; Hardware; Pins; Reflectometry; Software measurement; Statistical analysis; Testing; Throughput; Time domain analysis; Very large scale integration;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207835
