• DocumentCode
    3111440
  • Title

    Functional test program generation through interactive graphics

  • Author

    Tinaztepe, Cihan ; Ozguc, B.

  • Author_Institution
    Schlumberger Technol., San Jose, CA, USA
  • fYear
    1988
  • fDate
    12-14 Sep 1988
  • Firstpage
    551
  • Lastpage
    558
  • Abstract
    A methodology and the implementation are described of a graphical waveform editor which is used to create functional test programs on an engineering workstation. The system has been implemented such that timing and test patterns can be created or customized for different target testers utilizing diverse timing technologies. The graphical waveform editor is described in the context of an integrated test-program generation environment. The features of the editor include timing and pattern editing, subroutine definition, time set selection, logic state definition and translation, synchronization, event definition and search, pattern differences and other similar functions. A summary of user experience and planned enhancements is presented
  • Keywords
    automatic programming; automatic testing; engineering graphics; interactive systems; user interfaces; engineering workstation; functional test programs; graphical waveform editor; integrated test-program generation environment; interactive graphics; logic state definition; pattern editing; subroutine definition; synchronization; test patterns; time set selection; timing; translation; Automatic test pattern generation; Circuit testing; Graphics; Logic devices; Logic programming; Logic testing; Pins; Programming environments; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1988. Proceedings. New Frontiers in Testing, International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-0870-6
  • Type

    conf

  • DOI
    10.1109/TEST.1988.207836
  • Filename
    207836