• DocumentCode
    3111527
  • Title

    Numerical simulation of scattering from rough surfaces using a fast far-field iterative physical optics approach

  • Author

    Zahn, D. ; Sarabandi, K.

  • Author_Institution
    Radiat. Lab., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    11-16 July 1999
  • Firstpage
    530
  • Abstract
    The application of a fast far-field iterative physical optics (FIPO) method in conjunction with a Monte Carlo simulation for characterizing the bistatic scattering coefficient of random rough surfaces is examined in this paper. The FIPO method offers decreased memory and computation time restrictions compared to the standard numerical methods such as the method of moments (MoM), and decreased computation time compared to an exact iterative PO method. Results from the FIPO method are compared to the standard electric field integral equation (EFIE), the magnetic field integral equation (MFIE), a complete iterative PO (IPO), as well as the existing theoretical solutions for rough surfaces. It is demonstrated that memory requirements and computation time is significantly deceased while providing fairly accurate results for surfaces with moderate to low RMS slope.
  • Keywords
    Monte Carlo methods; electromagnetic wave scattering; iterative methods; physical optics; rough surfaces; EFIE; MFIE; Monte Carlo simulation; bistatic scattering coefficient; computation time; electric field integral equation; electromagnetic scattering; fast far-field iterative physical optics method; magnetic field integral equation; memory requirements; numerical simulation; random rough surfaces; Electromagnetic scattering; Integral equations; Iterative methods; Numerical simulation; Optical scattering; Optical surface waves; Optimized production technology; Physical optics; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.789194
  • Filename
    789194