Title :
D3FS: a demand driven deductive fault simulator
Author :
Smith, Steven P. ; Mercer, M. Ray ; Underwood, Bill
Author_Institution :
Microelectron. & Comput. Technol. Corp., Austin, TX, USA
Abstract :
A high-speed fault simulator is presented that combines demand-driven simulation techniques with a bit-encoded deductive fault simulation scheme. The simulator uses an efficient approach to the management of signal value and fault list structures intended to minimize disk thrashing during execution. Input cone analysis is used during preprocessing to identify gates with independent inputs so that optimized evaluation routines that include early cutoff can be used. Results are given for the demand-driven deductive fault simulator and contrasted with an earlier demand-driven parallel fault simulator
Keywords :
automatic test equipment; automatic testing; digital simulation; electronic engineering computing; fault location; logic testing; ATE; automatic testing; bit-encoded deductive fault simulation; demand driven deductive fault simulator; disk thrashing; fault list structures; high-speed fault simulator; logic testing; preprocessing; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Microelectronics; Sequential analysis; Vectors;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207840
