DocumentCode :
3111592
Title :
Development of a Distributed Process Mining System for Reactive Ion Etching Enhancement
Author :
Tsang, KF ; Lau, Henry CW ; Kwok, SK
Author_Institution :
Dept. of Ind. & Syst. Eng., Hong Kong Polytech. Univ., Hong Kong
fYear :
2006
fDate :
16-18 Aug. 2006
Firstpage :
282
Lastpage :
287
Abstract :
A Distributed Process Mining System (DPMS) is discussed in this paper which aims to optimize the process in order to offer shorter production time, easier quality defect identification and higher customer satisfaction. This proposed system is equipped with the idea of "distributed process mining" discovering the hidden relationships between each working decision in distributed manner. This method incorporates the On-line Analytical Processing (OLAP) and the decision tree-based Artificial Neural Networks (ANNs) algorithms into decision making for ensuring "doing the right things" within the process and relevant workflow. A case study of using Reactive Ion Etching (RIE) in a magnetic head manufacturer is included.
Keywords :
customer satisfaction; data mining; distributed processing; magnetic heads; neural nets; optimisation; production engineering computing; quality control; sputter etching; artificial neural networks; customer satisfaction; distributed process mining system; magnetic head manufacturer; online analytical processing; quality defect identification; reactive ion etching enhancement; Algorithm design and analysis; Artificial neural networks; Customer satisfaction; Decision making; Decision trees; Etching; Magnetic analysis; Magnetic heads; Manufacturing; Production systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Informatics, 2006 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
0-7803-9700-2
Electronic_ISBN :
0-7803-9701-0
Type :
conf
DOI :
10.1109/INDIN.2006.275794
Filename :
4053401
Link To Document :
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