Title :
A knowledge representation scheme for DFT
Author :
Souza, Desmond F D
Author_Institution :
Microelectron. & Comput. Technol. Corp., Austin, TX, USA
Abstract :
The knowledge-based approach to design for test (DFT) and test generation is discussed which depends heavily upon a storehouse of knowledge about DFT techniques and their application. The knowledge representation requirements of this knowledge-based approach are analyzed. An integrated knowledge representation scheme called KRAFT which addresses the representation requirements is presented in detail, and a scenario of use of such a DFT system is outlined. KRAFT is based on principles of types and functional and relational programming
Keywords :
automatic testing; circuit CAD; knowledge based systems; software packages; KRAFT; automatic testing; design for test; functional programming; knowledge representation; relational programming; test generation; Circuit testing; Design for testability; Design methodology; Functional programming; Kernel; Knowledge representation; Logic testing; Microelectronics; System testing; Time division multiplexing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207846
