DocumentCode
3111624
Title
A knowledge representation scheme for DFT
Author
Souza, Desmond F D
Author_Institution
Microelectron. & Comput. Technol. Corp., Austin, TX, USA
fYear
1988
fDate
12-14 Sep 1988
Firstpage
631
Lastpage
641
Abstract
The knowledge-based approach to design for test (DFT) and test generation is discussed which depends heavily upon a storehouse of knowledge about DFT techniques and their application. The knowledge representation requirements of this knowledge-based approach are analyzed. An integrated knowledge representation scheme called KRAFT which addresses the representation requirements is presented in detail, and a scenario of use of such a DFT system is outlined. KRAFT is based on principles of types and functional and relational programming
Keywords
automatic testing; circuit CAD; knowledge based systems; software packages; KRAFT; automatic testing; design for test; functional programming; knowledge representation; relational programming; test generation; Circuit testing; Design for testability; Design methodology; Functional programming; Kernel; Knowledge representation; Logic testing; Microelectronics; System testing; Time division multiplexing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207846
Filename
207846
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