Integrated test logic for video IC´s

A well-integrated chip-to-system design for test strategy and its implementation in a set of custom VLSI video chips are discussed. It supports both chip- and board-level testing of digital and analog circuits within the video subsystem. This test strategy permits testing of critical nodes inside the custom chips, making possible many tests that could not be performed with external test logic. The test coverage achieved eliminates the need for a bed-of-nails module tester. Test generation is very simple and test time is reduced by several orders of magnitude over previously used test methods. The method is cost effective, adding only 5% to the area of each chip