DocumentCode :
3111959
Title :
Tunable BaxSr1-xTiO3 FBARs based on SiO2/W Bragg reflectors
Author :
Vorobiev, Alexey ; Gevorgian, S.
Author_Institution :
Chalmers Univ., Gothenburg, Sweden
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1
Lastpage :
1
Abstract :
Experimental performance of tunable Film Bulk Acoustic Wave Resonators (FBAR) using paraelectric phase BaxSr1-xTiO3 (BSTO) thin films is reported. It is shown that the SiO2/W based Bragg reflectors deposited on high resistivity substrates withstand relatively high deposition temperatures (600C) of the ferroelectric films without defects and delamination. Tunable FBARs with Qf products more than 1000 are demonstrated experimentally. Potentials of increasing the Q-factor and tunability are considered.
Keywords :
Q-factor; acoustic resonators; barium compounds; bulk acoustic wave devices; ferroelectric thin films; strontium compounds; BaSrTiO; Bragg reflectors; FBAR; Q-factor; SiO2-W; deposition temperatures; ferroelectric films; film bulk acoustic wave resonators; high-resistivity substrates; paraelectric phase thin films; temperature 600 degC; Acoustic waves; Conductivity; Delamination; Ferroelectric films; Film bulk acoustic resonators; Optical films; Q factor; Substrates; Temperature; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5516013
Filename :
5516013
Link To Document :
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