DocumentCode
3111994
Title
G-RIDDLE: a formal analysis of logic designs conducive to the acceleration of backtracing
Author
Silberman, Gabriel M. ; Spillinger, Ilan
Author_Institution
Technion, Israel Inst. of Technol., Haifa, Israel
fYear
1988
fDate
12-14 Sep 1988
Firstpage
764
Lastpage
772
Abstract
A formal approach to the analysis of combinatorial gate-level designs is presented which produces information conducive to the acceleration of test generation algorithms. This analysis yields, as its main product, information which can be used to reduce the amount of effort expended during backtracing by guiding this process towards decision (assignments) less likely to cause conflicts and by minimizing the amount of work between backtracks. The G-RIDDLE approach is introduced for performing this analysis, as a refinement of the more general case which handles designs consisting of multi-input/multioutput combinatorial blocks. Experimental results are given for a popular benchmark of combinatorial gate-level designs
Keywords
VLSI; combinatorial circuits; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; G-RIDDLE; VLSI; backtracing; benchmark; combinatorial gate-level designs; logic CAD; logic designs; logic testing; test generation algorithms; Acceleration; Algorithm design and analysis; Benchmark testing; Circuit testing; Computer science; Information analysis; Logic design; Performance analysis; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207863
Filename
207863
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