• DocumentCode
    3111994
  • Title

    G-RIDDLE: a formal analysis of logic designs conducive to the acceleration of backtracing

  • Author

    Silberman, Gabriel M. ; Spillinger, Ilan

  • Author_Institution
    Technion, Israel Inst. of Technol., Haifa, Israel
  • fYear
    1988
  • fDate
    12-14 Sep 1988
  • Firstpage
    764
  • Lastpage
    772
  • Abstract
    A formal approach to the analysis of combinatorial gate-level designs is presented which produces information conducive to the acceleration of test generation algorithms. This analysis yields, as its main product, information which can be used to reduce the amount of effort expended during backtracing by guiding this process towards decision (assignments) less likely to cause conflicts and by minimizing the amount of work between backtracks. The G-RIDDLE approach is introduced for performing this analysis, as a refinement of the more general case which handles designs consisting of multi-input/multioutput combinatorial blocks. Experimental results are given for a popular benchmark of combinatorial gate-level designs
  • Keywords
    VLSI; combinatorial circuits; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; G-RIDDLE; VLSI; backtracing; benchmark; combinatorial gate-level designs; logic CAD; logic designs; logic testing; test generation algorithms; Acceleration; Algorithm design and analysis; Benchmark testing; Circuit testing; Computer science; Information analysis; Logic design; Performance analysis; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1988. Proceedings. New Frontiers in Testing, International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-0870-6
  • Type

    conf

  • DOI
    10.1109/TEST.1988.207863
  • Filename
    207863