Title :
Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.98CH36195)
Abstract :
The following topics were dealt with: computational and analytical modeling; measurement methods; thermal management; chip level thermal effects; thermal characterization
Keywords :
monolithic integrated circuits; analytical model; computational model; semiconductor chip; thermal management; thermal measurement;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1998. SEMI-THERM Proceedings 1998., Fourteenth Annual IEEE
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-4486-3
DOI :
10.1109/STHERM.1998.660379
