DocumentCode
3112261
Title
Fourteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.98CH36195)
fYear
1998
fDate
10-12 March 1998
Abstract
The following topics were dealt with: computational and analytical modeling; measurement methods; thermal management; chip level thermal effects; thermal characterization
Keywords
monolithic integrated circuits; analytical model; computational model; semiconductor chip; thermal management; thermal measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1998. SEMI-THERM Proceedings 1998., Fourteenth Annual IEEE
Conference_Location
San Diego, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-4486-3
Type
conf
DOI
10.1109/STHERM.1998.660379
Filename
660379
Link To Document