Title :
Experiences with concurrent fault simulation of diagnostic programs
Author :
Demba, Stephen ; Ulrich, Ernst ; Panetta, Karen ; Giramma, David
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
Abstract :
A methodology is presented for fault-simulation of system level diagnostic programs involving large models (50000 to 200000 gates) and long test sequences. Accuracy of memory models, interplay of target faults with diagnostic program development, and creation of shorter diagnostics are topics covered. Observation and statistical methods and tools used to investigate the operation of the faulty machine within the diagnostic program are also presented. Observation of individual faulty machines is critical to provide information about looping and erratic programs, violations of subprogram sequencing, etc. This methodology makes fault simulation of system diagnostics feasible
Keywords :
automatic testing; fault location; logic testing; multiprocessing systems; automatic testing; concurrent fault simulation; diagnostic programs; logic testing; memory models; subprogram sequencing; target faults; test sequences; Counting circuits; Fault detection; Graphics; Logic; Power engineering and energy; Size measurement; Statistical analysis; Statistics; System testing; Tires;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207875
