DocumentCode
3112357
Title
Automatic location of IC design errors using an E-beam system
Author
Melgara, M. ; Battu, M. ; Garino, P. ; Dowe, J. ; Vernay, Y.-J. ; Marzouki, Y. ; Boland, F.
Author_Institution
CSELT, Torino, Italy
fYear
1988
fDate
12-14 Sep 1988
Firstpage
898
Lastpage
907
Abstract
The ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive electron-beam debugging (EBD) system according to the strategies devised by the algorithms based on fault dictionary/hierarchical probing algorithm mixed search
Keywords
VLSI; application specific integrated circuits; automatic test equipment; circuit CAD; electron beam applications; fault location; integrated circuit testing; software packages; ADVICE; CAD; E-beam tester; IC design errors; circuit CAD; custom VLSI devices; design errors; fault dictionary/hierarchical probing algorithm; fault location; interactive electron-beam debugging; Algorithm design and analysis; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Debugging; Design automation; Dictionaries; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-8186-0870-6
Type
conf
DOI
10.1109/TEST.1988.207878
Filename
207878
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