Title :
On benchmarking digital testing systems
Author :
Mourad, Samiha ; McCluskey, Edward J.
Abstract :
An approach to quantify the digital testing system (DTS) attributes is presented. The quantification will help in determining criteria according to which benchmark circuits are selected. Two main parameters that can be used in the comparison are the speed of operation and memory requirements. Attempts are made to relate each of these two parameters to different attributes of the DTS. Experiments were carried out using a commercial automatic test-pattern generator to generate test sets for some ISCAS circuits. The results of the experiments are presented
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; ATE; ISCAS circuits; automatic test-pattern generator; automatic testing; benchmark circuits; digital testing systems; memory requirements; quantification; speed of operation; Automatic logic units; Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Logic testing; System testing;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207892
