Title :
The non-linear feedback shift-register as a built-in self-test (BIST) resource
Author :
Marinos, Peter N.
Author_Institution :
Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
Abstract :
Properties of nonlinear-feedback shift registers (NLFSRs), are studied and their suitability as built-in self-test (BIST) components in VLSI circuits is investigated. The feasibility is discussed of mapping fault-free circuit-under-test response to one of the least frequently occurring signatures within the signature space of the n-stage NLFSR. A number of illustrations are offered that justify the serious consideration of NLFSRs as components for use in BIST applications
Keywords :
VLSI; automatic testing; feedback; integrated circuit testing; integrated logic circuits; logic testing; shift registers; BIST; IC testing; VLSI circuits; built-in self-test; fault-free circuit-under-test response; logic testing; non-linear feedback shift-register; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Data compression; Feedback circuits; Probability; Size control; Test pattern generators; Very large scale integration;
Conference_Titel :
Test Conference, 1988. Proceedings. New Frontiers in Testing, International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-0870-6
DOI :
10.1109/TEST.1988.207893
