• DocumentCode
    3112763
  • Title

    Neuroelectrical source imaging of mu rhythm control for BCI applications

  • Author

    Mattiocco, M. ; Babiloni, F. ; Mattia, D. ; Bufalari, S. ; Sergio, S. ; Salinari, S. ; Marciani, M.G. ; Cincotti, F.

  • Author_Institution
    Clinical Neurophysiopathology Unit, Fondazione Santa Lucia IRCCS, Roma
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    980
  • Lastpage
    983
  • Abstract
    In the last decade, the possibility to noninvasively estimate cortical activity has been highlighted by the application of the techniques known as high resolution EEG. These techniques include a subject´s multi-compartment head model (scalp, skull, dura mater, cortex) constructed from individual magnetic resonance images, multi-dipole source model, and regularized linear inverse source estimates of cortical current density. The aim of this paper is to demonstrate that the use of cortical activity estimated from noninvasive EEG recordings of motor imagery is useful in the context of a brain computer interface as compared with others scalp spatial filters usually used on-line
  • Keywords
    bioelectric potentials; current density; electroencephalography; man-machine systems; medical computing; neurophysiology; user interfaces; brain computer interface applications; cortical activity; cortical current density; high resolution EEG; magnetic resonance images; motor imagery; mu rhythm control; multicompartment head model; multidipole source model; neuroelectrical source imaging; noninvasive EEG recordings; regularized linear inverse source estimates; Brain modeling; Current density; Electroencephalography; High-resolution imaging; Magnetic heads; Magnetic resonance; Magnetic resonance imaging; Rhythm; Scalp; Skull; Brain computer interface; High resolution EEG; Linear inverse source estimate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260128
  • Filename
    4461917