DocumentCode :
3113066
Title :
Detecting E and H fields with microstrip transmission lines
Author :
Chen, Tze Wee ; Maloney, Timothy J. ; Chou, Bruce
Author_Institution :
Centre for Integrated Syst., Stanford Univ., Stanford, CA
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
6
Abstract :
Microstrip-like transmission lines are used to detect transient electric and magnetic (E and H) fields. Theory and experiment are compared for three different cases. The method can detect E and H fields on a ground plane, or may be integrated into a closed platform for E-H measurements during EMC testing. An application example using a desktop computer is shown. In situ measurements in a closed platform during EMC testing show that system ESD failures are caused by E-H fields, and not by direct voltage or current stress. Therefore, E-H field information measured by using microstrip-like transmission lines on PCBs in a closed platform during EMC tests will give insights to the exact nature of system failures due to ESD.
Keywords :
electromagnetic compatibility; electromagnetic fields; microstrip lines; printed circuits; E-H field measurements; EMC testing; PCB; electromagnetic compatibility; microstrip transmission lines; printed circuit board detectors; transient electric fields; transient magnetic fields; Application software; Electromagnetic compatibility; Electrostatic discharge; Magnetic field measurement; Microstrip; Power system transients; System testing; Transmission line measurements; Transmission line theory; Transmission lines; Charged tip discharge; ElectroMagnetic Compatibility (EMC); Printed Circuit Board (PCB) detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652009
Filename :
4652009
Link To Document :
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