Title :
Aspects of using the IEC 61000-4-20 for transient testing with broadband signals
Author :
Thye, Holger ; Zamow, Dirk ; Koch, Michael ; Garbe, Heyno
Author_Institution :
Inst. for the Basics of Electr. Eng. & Meas. Sci., Leibniz Univ. Hannover, Hannover
Abstract :
This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.
Keywords :
IEC standards; TEM cells; emission; immunity testing; waveguides; IEC 61000-4-20; broadband signals; emission testing; immunity testing; international standard; transient measurements; transient testing; transverse electromagnetic waveguides; Electric variables measurement; Electromagnetic measurements; Electromagnetic waveguides; Frequency; IEC standards; Immunity testing; Magnetic field measurement; Measurement standards; Pollution measurement; Pulse measurements; IEC 61000-4-20; transient measurements; ultra wideband signal;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652025
