Aspects of using the IEC 61000-4-20 for transient testing with broadband signals

Author

Thye, Holger ; Zamow, Dirk ; Koch, Michael ; Garbe, Heyno

Author_Institution

Inst. for the Basics of Electr. Eng. & Meas. Sci., Leibniz Univ. Hannover, Hannover

fYear

2008

fDate

18-22 Aug. 2008

Firstpage

1

Lastpage

5

Abstract

This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.

Keywords

IEC standards; TEM cells; emission; immunity testing; waveguides; IEC 61000-4-20; broadband signals; emission testing; immunity testing; international standard; transient measurements; transient testing; transverse electromagnetic waveguides; Electric variables measurement; Electromagnetic measurements; Electromagnetic waveguides; Frequency; IEC standards; Immunity testing; Magnetic field measurement; Measurement standards; Pollution measurement; Pulse measurements; IEC 61000-4-20; transient measurements; ultra wideband signal;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on

Conference_Location

Detroit, MI

Print_ISBN

978-1-4244-1699-8

Electronic_ISBN

978-1-4244-1698-1

Type

conf

DOI

10.1109/ISEMC.2008.4652025

Filename

4652025