• DocumentCode
    3113577
  • Title

    Thermal performance of 1.55μm InGaAlAs quantum well buried heterostructure lasers

  • Author

    Sayid, Sayid Ally ; Marko, Igor Pavlovich ; Cannard, Paul J. ; Chen, Xin ; Rivers, Lelsey J. ; Lealman, Ian F. ; Sweeney, Stephen John

  • Author_Institution
    Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
  • fYear
    2010
  • fDate
    May 31 2010-June 4 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We have investigated the threshold current Ith and differential quantum efficiency as the function of temperature in InGaAlAs/InP multiple quantum well (MQWs) buried heterostructure (BH) lasers. We find that the temperature sensitivity of Ith is due to non-radiative recombination which accounts for up to ~80% of Jth at room temperature. Analysis of spontaneous emission emitted from the devices show that the dominant non-radiative recombination process is consistent with Auger recombination. We further show that the above threshold differential internal quantum efficiency, ηi, is ~80% at 20°C remaining stable up to 80°C. In contrast, the internal optical loss, αi, increases from 15 cm-1 at 20°C to 22 cm-1 at 80°C, consistent with inter-valence band absorption (IVBA). This suggests that the decrease in power output at elevated temperatures is associated with both Auger recombination and IVBA.
  • Keywords
    Auger effect; III-V semiconductors; aluminium compounds; electron-hole recombination; gallium compounds; indium compounds; quantum well lasers; Auger recombination; InGaAlAs-InP; differential quantum efficiency; inter-valence band absorption; multiple quantum well buried heterostructure lasers; non-radiative recombination process; temperature 20 C; temperature 80 C; threshold current; wavelength 1.55 mum; Indium phosphide; Optical losses; Optical sensors; Quantum well devices; Quantum well lasers; Radiative recombination; Spontaneous emission; Stimulated emission; Temperature sensors; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide & Related Materials (IPRM), 2010 International Conference on
  • Conference_Location
    Kagawa
  • ISSN
    1092-8669
  • Print_ISBN
    978-1-4244-5919-3
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2010.5516088
  • Filename
    5516088