Title :
An experimental thermal characterization of a 272 PBGA within an automotive engine controller module
Author :
Triplett, C. Eric ; Joiner, Bennett
Author_Institution :
Motorola Semicond. Products Sector, Austin, TX, USA
Abstract :
Results are presented for the thermal characterization of a simulated automotive engine control module in both natural and forced convection environments. The module consists of a 4-layer printed circuit board mounted inside a cast aluminum box that has similar dimensions to an actual engine controller. A 272-lead plastic ball grid array (PBGA) package containing a thermal test die is mounted on the circuit board. The board also has auxiliary patch heaters attached to its surface which simulate the additional components in an engine controller. The aluminum box has cartridge heaters mounted on the outside of the box that simulate power dissipation from the power drivers. Results show that junction temperature rise above ambient is strongly dependent on die input power and the total power dissipation on the board. Junction temperature rise is more weakly dependent on cartridge heater input power, box orientation, and die size. Junction temperature rise above ambient divided by package power is a linear function of board temperature rise above ambient divided by package power
Keywords :
automotive electronics; controllers; cooling; forced convection; heating elements; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; modules; natural convection; plastic packaging; thermal analysis; Al; PBGA; automotive engine controller module; auxiliary patch heaters; board temperature; box orientation; cartridge heater input power; cartridge heaters; cast aluminum box; die input power; die size; engine controller; forced convection environment; junction temperature; multilayer printed circuit board module; natural convection environment; package power; plastic ball grid array; power dissipation; power drivers; simulated automotive engine control module; thermal characterization; thermal test die; Aluminum; Automotive engineering; Circuit simulation; Circuit testing; Engines; Packaging; Power dissipation; Printed circuits; Temperature dependence; Thermal force;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1998. SEMI-THERM Proceedings 1998., Fourteenth Annual IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-4486-3
DOI :
10.1109/STHERM.1998.660386