Title :
Configurable EEPROMS for ASICS
Author :
Carney, Bob ; Lucero, Elroy ; Mendel, Robi ; Reiter, Herb
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
Abstract :
A 5-V only, variable-size EEPROM (electrically erasable programmable read-only memory) is discussed. A test chip providing 256×8-bit memory is described, as well as the methodology used to implement it. Certain special nonvolatile memory circuits are investigated. Application areas, manufacturing issues, and testing techniques are also considered
Keywords :
PROM; integrated memory circuits; 2 kbits; configurable memory; electrically erasable programmable read-only memory; manufacturing issues; nonvolatile memory circuits; test chip; testing techniques; variable-size EEPROM; Application specific integrated circuits; DH-HEMTs; EPROM; Latches; Logic arrays; Power generation; Power supplies; Random access memory; Read-write memory; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988
Conference_Location :
Rochester, NY
DOI :
10.1109/CICC.1988.20795
