Title :
Automatic generation of analog test programs
Author_Institution :
Siemens AG, Corp. Res. & Dev., Munich, Germany
fDate :
29 May-1 Jun 1990
Abstract :
A fast, competitive CAD-procedure requires a high degree of automatization that also includes the generation of the test program. Starting with an analog test plan written by the user and a circuit description, a test program is generated automatically for analog circuits and for the analog part of hybrid circuits. The test program is synthesized from different, proven software modules. The additional hardware, which is required for the test, is realized in the standardized hardware modules
Keywords :
VLSI; analogue circuits; application specific integrated circuits; circuit CAD; CAD-procedure; analog test programs; circuit description; hybrid circuits; software modules; standardized hardware modules; Analog circuits; Automatic programming; Automatic testing; Circuit testing; Clocks; Connectors; Hardware; Hybrid power systems; Software testing; Switching circuits;
Conference_Titel :
Euro ASIC '90
Conference_Location :
Paris
Print_ISBN :
0-8186-2066-8
DOI :
10.1109/EASIC.1990.207956
