DocumentCode
3113787
Title
Automatic generation of analog test programs
Author
Hanstein, Bernd
Author_Institution
Siemens AG, Corp. Res. & Dev., Munich, Germany
fYear
1990
fDate
29 May-1 Jun 1990
Firstpage
290
Lastpage
295
Abstract
A fast, competitive CAD-procedure requires a high degree of automatization that also includes the generation of the test program. Starting with an analog test plan written by the user and a circuit description, a test program is generated automatically for analog circuits and for the analog part of hybrid circuits. The test program is synthesized from different, proven software modules. The additional hardware, which is required for the test, is realized in the standardized hardware modules
Keywords
VLSI; analogue circuits; application specific integrated circuits; circuit CAD; CAD-procedure; analog test programs; circuit description; hybrid circuits; software modules; standardized hardware modules; Analog circuits; Automatic programming; Automatic testing; Circuit testing; Clocks; Connectors; Hardware; Hybrid power systems; Software testing; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Euro ASIC '90
Conference_Location
Paris
Print_ISBN
0-8186-2066-8
Type
conf
DOI
10.1109/EASIC.1990.207956
Filename
207956
Link To Document