Title :
Towards verifying parametrised hardware libraries with relative placement information [parametrised read parameterised]
Author :
McKeever, Steve ; Luk, Wayne ; Derbyshire, Arran
Author_Institution :
Dept. of Comput., Imperial Coll., London, UK
Abstract :
This paper presents a framework for verifying compilation tools for parameterised hardware libraries with placement information. Such libraries are captured in Pebble, a simple declarative language based on structural VHDL, and can contain placement information to guide circuit layout. Relative placement information enables control of circuit layout at a higher level of abstraction than placement information in the form of explicit coordinates. We provide a functional specification of a procedure for compiling Pebble programs with relative placement information into Pebble programs with explicit placement coordinate information. We present an overview of the steps for verifying this procedure based on pass separation techniques. The compilation procedure can be used in conjunction with partial evaluation to optimise the size and speed of circuits described using relative placement. Our approach has been used for optimising a pattern matcher design, which results in a 33% reduction in resource usage.
Keywords :
circuit layout CAD; formal specification; formal verification; hardware description languages; logic CAD; optimising compilers; partial evaluation (compilers); pattern matching; Pebble programs; circuit layout; compilation tools verification; declarative language; explicit coordinates; functional specification; parametrised hardware libraries; pass separation technique; pattern matcher design; relative placement information; structural VHDL; Automatic control; Circuits; Design optimization; Educational institutions; Field programmable gate arrays; Hardware; Pattern matching; Programmable logic arrays; Resource management; Software libraries;
Conference_Titel :
System Sciences, 2003. Proceedings of the 36th Annual Hawaii International Conference on
Print_ISBN :
0-7695-1874-5
DOI :
10.1109/HICSS.2003.1174812