Title :
Detection of yield trends
Author :
Pleskacz, Witold A. ; Maly, Wojciech ; Heineken, Hans T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This paper proposes a yield data filtration procedure. This procedure is intended for the reduction of noise in the yield data. Such a reduction is a key step in the detection of yield trends that have to be known for yield modeling and yield analysis purposes
Keywords :
integrated circuit measurement; integrated circuit modelling; integrated circuit yield; production testing; IC measurement; IC yield; noise reduction; yield analysis; yield data filtration; yield modeling; yield trends; Area measurement; Integrated circuit modeling; Integrated circuit noise; Loss measurement; Noise reduction; Semiconductor device modeling; Testing; Time measurement; Virtual manufacturing; Yield estimation;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628310
