Title :
A test strategy for mixed analog/digital ASICS
Author :
Valdenaire, Patrick ; Gauthron, Christophe
Author_Institution :
VLSI Technol. Inc., San Jose, CA, USA
fDate :
29 May-1 Jun 1990
Abstract :
Typical examples of analog functions and their testing are described. It is shown, that these tests can be performed on digital testers. A test strategy for mixed ASICs is proposed, as an extension of techniques applicable to digital ASICs
Keywords :
application specific integrated circuits; integrated circuit testing; analog functions; digital testers; mixed analog/digital ASICS; test strategy; Application specific integrated circuits; Automatic testing; Circuit testing; Design automation; Logic testing; Performance analysis; Performance evaluation; Software libraries; System testing; Very large scale integration;
Conference_Titel :
Euro ASIC '90
Conference_Location :
Paris
Print_ISBN :
0-8186-2066-8
DOI :
10.1109/EASIC.1990.207958
