Title :
Hierarchical test generation for data path
Author :
Jay, C. ; De Paulet, M. Crastes ; Karam, M. ; Saucier, G.
Author_Institution :
VLSI Technol. Inc., Valbonne, France
fDate :
29 May-1 Jun 1990
Abstract :
A method of hierarchical test generation for data path is proposed. The test patterns are generated for the basic blocks of a classical data path library. These test patterns are propagated to the inputs and to the outputs of the data path by two methods. The first one, practically implemented, enumerates backpropagation paths based on structural considerations, selects one and then performs consistency for real local test patterns. The second one works directly on symbolic values and uses immediately the back and forward propagation paths. Both methods take advantage of the existence of transparent blocks
Keywords :
PROLOG; automatic testing; logic testing; software tools; backpropagation paths; data path; hierarchical test generation; real local test; symbolic values; test patterns; transparent blocks; Backpropagation; Libraries; Logic testing; Pain; Performance evaluation; Prototypes; Registers; Space exploration; System testing; Test pattern generators;
Conference_Titel :
Euro ASIC '90
Conference_Location :
Paris
Print_ISBN :
0-8186-2066-8
DOI :
10.1109/EASIC.1990.207963