DocumentCode :
3113952
Title :
Decel lens system for low-energy ion implantation with high dose uniformity
Author :
Teichert, Jochen ; von Borany, Johannes
Author_Institution :
Inst. fur Ionenstrahlphys. und Materialforschung, Forschungszentrum Rossendorf e.V., Dresden, Germany
fYear :
2000
fDate :
2000
Firstpage :
388
Lastpage :
391
Abstract :
In this paper we report on the design of a decel lens system for low energy ion implantation. The novel lens system consisting of a converging and a diverging lens in a compact arrangement allows one to compensate the spherical aberration. Therefore implantation into large areas at low energies can be performed with high dose uniformity. The implantation chamber with the decel lens system is fitted to the beamline 2 of the medium energy implanter DANFYSIK 1090 at the Forschungszentrum Rossendorf. Using a beam energy of 30 keV the ions can be decelerated up to 2 keV with a dose uniformity of <5% for 100 mm diameter
Keywords :
aberrations; beam handling equipment; ion implantation; ion optics; lenses; particle beam focusing; 100 mm; 30 keV; Forschungszentrum Rossendorf; beamline 2; compact arrangement; converging lens; decel lens system; design; diverging lens; dose uniformity; high dose uniformity; low-energy ion implantation; medium energy implanter DANFYSIK 1090; spherical aberration; Current density; Electrostatics; Ion beams; Ion implantation; Lenses; Microelectronics; Optical design; Particle beam optics; Silicon; Vacuum systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology, 2000. Conference on
Conference_Location :
Alpbach
Print_ISBN :
0-7803-6462-7
Type :
conf
DOI :
10.1109/.2000.924169
Filename :
924169
Link To Document :
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