• DocumentCode
    3113969
  • Title

    Performance of IW-630 ion implanter for 300-mm wafers

  • Author

    Nishihashi, T. ; Yokoo, H. ; Hisamune, T. ; Shimizu, T. ; Fukui, R. ; Suzuki, H. ; Kageyama, K. ; Niikura, K. ; Fuwa, K. ; Oka, T. ; Kashimoto, K. ; Fujiyama, J. ; Sakurada, Y.

  • Author_Institution
    ULVAC Japan Ltd., Kanagawa, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    392
  • Lastpage
    395
  • Abstract
    While micro-fineness of semiconductor devices is taking place rapidly, improvements of ion implanters have also been made to achieve flexible use in advanced facilities. IW-630 is a 300-mm ion implanter that provides as small as 17.2 m2 footprint, wide energy range and wide dosage range in order to satisfy the requirements in the advanced facilities. The energy range from 5 to 300 keV is achieved using single-charged ions. In high-energy implantation using multiple-charged ions, energy contamination is free by the final energy filter (collimator magnet) installed after post-acceleration. The implantation dose shift and the degradation of implantation uniformity by out-gassing from photo-resist, which mostly occurs at the time of implanting high-power beams, have been completely solved by ULVAC original cryo-pumping systems. So stable implantation characteristics have been achieved. In wafer handling, unlike the batch system or cassette-load lock system, the load-lock system adopted handles wafers one by one. The practical transfer system and the implant processing capacities realize 200 wafers/hr as the row throughput
  • Keywords
    beam handling equipment; cryopumping; ion implantation; photoresists; semiconductor doping; 300 mm; 300-mm wafers; 5 to 300 keV; IW-630 ion implanter; cryo-pumping; dose shift; energy contamination; energy filter; footprint; high-energy implantation; implantation uniformity; load-lock system; micro-fineness; multiple-charged ions; out-gassing; photo-resist; post-acceleration; semiconductor devices; single-charged ions; wafer handling; wide dosage range; wide energy range; Acceleration; Contamination; Degradation; Filters; Fluid flow; Implants; Investments; Ion implantation; Resists; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology, 2000. Conference on
  • Conference_Location
    Alpbach
  • Print_ISBN
    0-7803-6462-7
  • Type

    conf

  • DOI
    10.1109/.2000.924170
  • Filename
    924170