• DocumentCode
    3114008
  • Title

    A Model-Based Approach for Assessing Parkinsonian Gait and Effects of Levodopa and Deep Brain Stimulation

  • Author

    Cho, Catherine ; Osaki, Yasuhiro ; Kunin, Mikhail ; Cohen, Bernard ; Olanow, C. Warren ; Raphan, Theodore

  • Author_Institution
    Dept. of Neurology, Mount Sinai Sch. of Med., New York, NY
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    1228
  • Lastpage
    1231
  • Abstract
    Gait and balance disturbances are amongst the most disabling features of Parkinson´s disease (PD), and are not adequately controlled with currently available medical and surgical therapies. Development of objective quantitative measures of these abnormalities would greatly help in the assessment and the development of therapeutic interventions. Recently, we developed a methodology, using dynamical system theory, for testing gait with a state-of-the-art motion-detection system (OPTOTRAK 3020, Northern Digital, Inc.). We also developed a model of the dynamics of the foot that predicts the stance and swing phase dynamics of normal walking. In the present study, we determined whether model parameters were altered in subjects with PD when they were tested on/off levodopa (LD) and on/off deep brain stimulation (DBS) in a 2times2 matrix
  • Keywords
    brain; diseases; drugs; gait analysis; mechanoception; neurophysiology; patient treatment; physiological models; OPTOTRAK 3020; Parkinson´s disease; balance disturbances; dynamical system theory; foot dynamics model; gait analysis; motion-detection system; on-off deep brain stimulation; on-off levodopa brain stimulation; stance phase dynamics; swing phase dynamics; therapeutic interventions; Brain modeling; Brain stimulation; Foot; Legged locomotion; Medical control systems; Medical treatment; Parkinson´s disease; Predictive models; Surgery; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259439
  • Filename
    4461980