Title :
The 3DV-FMM method to calculate scattering from inhomogeneous dielectric objects
Author :
Xiao-Guang Chen ; Ya-Qiu Jin
Author_Institution :
Dept. of Electron. Eng., Fudan Univ., Shanghai, China
Abstract :
Numerical methods for fast and efficient solution of electromagnetic (EM) scattered fields from arbitrary shaped, 3-D scatterers are of great importance not only in EM scattering simulation but also in scattering inversion. Since the integral equation satisfies the radiation boundary condition, the MOM method is usually applied. However, a dense matrix derived by using the MOM method requires a large computer memory and long CPU time. Thus, application of the conventional MOM to the integral equation is always restrictive. In this paper, the fast multipole method (FMM) is developed to solve the 3D volume integral problems. Scattering from a complex 3D dielectric object can be efficiently and accurately calculated. Numerical simulations of scattering from 3D inhomogeneous, multiobjects are discussed and are compared with the conventional MOM results.
Keywords :
dielectric bodies; electromagnetic fields; electromagnetic wave scattering; inhomogeneous media; integral equations; inverse problems; method of moments; radar cross-sections; 3D dielectric object; 3D scatterers; 3D volume integral problems; 3DV-FMM method; EM scattered fields; EM scattering simulation; EM wave scattering; MOM method; bistatic RCS; dense matrix; electromagnetic scattered fields; fast multipole method; homogeneous cube; inhomogeneous dielectric objects; integral equation; multi-dielectric cube; numerical simulations; radiation boundary condition; scattering inversion; Application software; Boundary conditions; Computational modeling; Dielectrics; Electromagnetic fields; Electromagnetic radiation; Electromagnetic scattering; Integral equations; Message-oriented middleware; Numerical simulation;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
DOI :
10.1109/APS.1999.789324