DocumentCode :
3114099
Title :
Microwave-induced electromigration in multicomponent metallic alloys
Author :
Vaucher, S. ; Bernau, L. ; Stir, M. ; Ishizaki, K. ; Catala-Civera, J. ; Nicula, R.
Author_Institution :
Empa- Swiss Federal Laboratories for Materials Testing and Research, Thun, Switzerland
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1
Lastpage :
1
Abstract :
The crystallization of amorphous FeCoCuZrAlSiB alloy ribbons during microwave heating was investigated in situ using time-resolved X-ray powder diffraction. The formation of the nanocrystalline a-(Fe,Co)(SiAl) phase during the primary crystallization stage is followed by the crystallization of the residual glassy matrix. Scanning electron microscopy analysis after microwave exposure reveals the formation of nanosized hillocks evenly distributed over the ribbon surfaces. Local composition analysis by energy-dispersive spectroscopy shows that the surface clusters are enriched in Cu and Al. The occurrence of this typical electromigration effect imposes a restriction on the exposure of metallic ribbons to microwave fields and reinforces the need for prior characterization in particular by in situ time-resolved techniques.
Keywords :
Amorphous materials; Crystallization; Electromagnetic heating; Electromigration; Electrons; Laboratories; Materials testing; Microwave technology; Powders; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5516111
Filename :
5516111
Link To Document :
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