Title :
A four command BCI system based on the SSVEP protocol
Author :
Maggi, L. ; Parini, S. ; Piccini, L. ; Panfili, G. ; Andreoni, G.
Author_Institution :
Bioeng. Dept., Politecnico di Milano, Milan
fDate :
Aug. 30 2006-Sept. 3 2006
Abstract :
This paper discusses the development of a four command BCI system. This system is composed of a wearable electroencephalogram acquisition unit interfaced to a computer by a wireless Bluetoothreg (BT) connection. The implemented system relies on the steady-state visual evoked potential (SSVEP) protocol applied to a four selection system. In order to achieve the maximum reliability against false positives a five class classifier was used considering the idle state as an independent class. In order to maximize the usability of the system a two channel solution was tested and adopted. The BCI algorithm was based on a supervised multi-class classifier implemented by combining different binary regularized linear discriminant analysis (RLDA) classifiers. The biofeedback was evaluated by combining the resultant time signed distance with quality index related to the number of coherent identification obtained with the one-vs-all approach
Keywords :
Bluetooth; biomedical communication; electroencephalography; graphical user interfaces; learning (artificial intelligence); man-machine systems; medical signal processing; neurophysiology; pattern classification; signal classification; visual evoked potentials; GUI module; binary regularized linear discriminant analysis classifiers; biofeedback; coherent identification; four-command BCI system; reliability; steady-state visual evoked potential protocol; supervised multiclass classifier; wearable electroencephalogram acquisition unit; wireless Bluetooth connection; Biological control systems; Biomedical monitoring; Communication system control; Control systems; Electrodes; Electroencephalography; Engines; Graphical user interfaces; Protocols; USA Councils;
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location :
New York, NY
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2006.260353