• DocumentCode
    3114319
  • Title

    Improved cooling on the Varian E220/E500 series implanters

  • Author

    Rhoads, Kevin ; Larsen, Kenji ; Evans, Morgan

  • Author_Institution
    Varian Semicond. Equip. Assoc. Inc., Gloucester, MA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    456
  • Lastpage
    459
  • Abstract
    Single wafer ion implanter manufacturers have traditionally relied on gas-cooled mechanical clamps for higher beam power applications and non gas-cooled electrostatic clamps (ESC) for lower power applications. Varian has recently developed a mid-power, non-gas-cooled ESC. This improvement allows for higher wafer throughput than a traditional ESC without the complexity of gas cooling
  • Keywords
    cooling; electrostatic devices; ion implantation; semiconductor doping; Varian E220/E500 series implanters; cooling; higher beam power applications; lower power applications; mid-power nongas-cooled electrostatic clamps; single wafer ion implanter manufacturers; wafer throughput; Clamps; Cooling; Current measurement; Electrostatics; Fluid flow measurement; Heat transfer; Implants; Semiconductor device manufacture; Temperature measurement; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology, 2000. Conference on
  • Conference_Location
    Alpbach
  • Print_ISBN
    0-7803-6462-7
  • Type

    conf

  • DOI
    10.1109/.2000.924186
  • Filename
    924186