Title :
Thin film transistors modeling and parameters extraction tool
Author :
Declerck, O. ; Bardyn, J.-P.
Author_Institution :
CETIA, Toulon, France
fDate :
29 May-1 Jun 1990
Abstract :
Presents a parameters extraction tool for transistors modeling activity, which gives way to characterize not only MOS processes but also to check and validate four terminal transistor models such as polysilicon thin film transistors
Keywords :
semiconductor device models; thin film transistors; MOS processes; four terminal transistor models; parameters extraction tool; polysilicon thin film transistors; transistors modeling activity; Active matrix liquid crystal displays; Circuit simulation; Data mining; Databases; FETs; MOSFET circuits; Parameter extraction; SPICE; Thin film transistors; Voltage;
Conference_Titel :
Euro ASIC '90
Conference_Location :
Paris
Print_ISBN :
0-8186-2066-8
DOI :
10.1109/EASIC.1990.207984
