Title :
Latch-up characterization of semicustom using ATE
Author_Institution :
Telettra SpA, Vimercate, Italy
fDate :
29 May-1 Jun 1990
Abstract :
An ATE approach for latch-up static test is proposed that allows a quick and complete characterization of devices even with a very high pin count. The software tool is described and some results presented
Keywords :
CMOS integrated circuits; application specific integrated circuits; automatic test equipment; integrated circuit testing; software tools; ATE; latch-up static test; pin count; semicustom; software tool; CMOS technology; Circuits; Current supplies; Geometry; Pins; Power supplies; Software tools; Switches; Testing; Voltage control;
Conference_Titel :
Euro ASIC '90
Conference_Location :
Paris
Print_ISBN :
0-8186-2066-8
DOI :
10.1109/EASIC.1990.207985
