DocumentCode
3114369
Title
Latch-up characterization of semicustom using ATE
Author
Gaviraghi, S.
Author_Institution
Telettra SpA, Vimercate, Italy
fYear
1990
fDate
29 May-1 Jun 1990
Firstpage
439
Lastpage
443
Abstract
An ATE approach for latch-up static test is proposed that allows a quick and complete characterization of devices even with a very high pin count. The software tool is described and some results presented
Keywords
CMOS integrated circuits; application specific integrated circuits; automatic test equipment; integrated circuit testing; software tools; ATE; latch-up static test; pin count; semicustom; software tool; CMOS technology; Circuits; Current supplies; Geometry; Pins; Power supplies; Software tools; Switches; Testing; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Euro ASIC '90
Conference_Location
Paris
Print_ISBN
0-8186-2066-8
Type
conf
DOI
10.1109/EASIC.1990.207985
Filename
207985
Link To Document