Title :
New radiated RF immunity/susceptibility test method using RF-pulsed rotating-EM field
Author :
Murano, Kimitoshi ; Tayarani, Majid ; Xiao, Fengchao ; Kami, Yoshio
Author_Institution :
Sch. of Eng., Tokai Univ., Hiratsuka
Abstract :
A new radiated radio-frequency (RF) immunity/susceptibility test method using an RF-pulsed rotating-electromagnetic (EM) field is proposed. Controlling the pulse width can generate the RF-pulsed signal having an arbitrary bandwidth. By using such RF-pulsed rotating-EM field as an incident-EM field of the immunity/susceptibility test, it is possible to easily investigate the immunity-weak points of electronic equipments. In this paper, the basic characteristics of the RF-pulsed rotating-EM field are clarified. Moreover, some susceptibility characteristics of a cavity with a slit measured by using the RF-pulsed rotating-EM field are shown as an example.
Keywords :
electromagnetic fields; radiofrequency interference; RF-pulsed rotating-EM Field; RF-pulsed rotating-electromagnetic field; RF-pulsed signal; electronic equipments; radiated radio-frequency immunity test method; Bandwidth; Electromagnetic fields; Electromagnetic radiation; Electronic equipment; Electronic equipment testing; Immunity testing; Radio frequency; Rotation measurement; Signal generators; Space vector pulse width modulation;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652074
