• DocumentCode
    3114402
  • Title

    Time-frequency evaluation of segmentation methods for neonatal EEG signals

  • Author

    Wong, Lisa ; Abdulla, Waleed

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Auckland Univ.
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    1303
  • Lastpage
    1306
  • Abstract
    In order to analyse non-stationary signals, like neonatal EEG, it is sometimes easier to segment signals into pseudo-stationary segments. An evaluation was performed on three previously proposed EEG segmentation methods in order to determine which method is most suited to neonatal EEG analysis. The three methods evaluated are spectral error measurement (SEM), generalised likelihood ratio (GLR) and non-linear energy operator (NLEO). A windowed version of NLEO was also tested in an attempt to minimise the effect of any temporary transients on the segmentation algorithm. The results from the segmentation algorithm were compared with the time-frequency distribution of the original signal to determine the appropriateness of the segments. It was found that GLR was the most appropriate segmentation method, and that the windowed version of the NLEO method performed better than the non-windowed version, both of which are less computationally expensive than the other methods
  • Keywords
    electroencephalography; medical signal processing; paediatrics; spectral analysis; time-frequency analysis; EEG segmentation methods; electroencephalograms; generalised likelihood ratio; neonatal EEG; nonlinear energy operator; nonstationary signals; pseudostationary segments; spectral error measurement; time-frequency evaluation; windowed version; Cities and towns; Electroencephalography; Pediatrics; Scalp; Signal analysis; Signal processing; Signal processing algorithms; Testing; Time frequency analysis; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259472
  • Filename
    4461999