Title :
Time varying instruction current EMC simulation improvement
Author :
Yuan, Shih-Yi ; Chung, Huai-En ; Chen, Chiu-Kuo ; Liao, Shry-Sann
Author_Institution :
IC-EMC center, Feng Chia Univ., Taichung
Abstract :
Other papers have suggested that different application programs running on a digital system have their own EMC effects. This paper proposes two efficient and flexible techniques to improve the simulation efficiency of techniques instruction current waveform proposed by our laboratory. Experimental results show the efficiency is improved while the simulation quality remains the same.
Keywords :
electromagnetic compatibility; electromagnetic interference; EMC simulation improvement; digital system; instruction current waveform technique; time varying instruction current; Circuit simulation; Digital systems; Electromagnetic compatibility; Electromagnetic interference; Feeds; Integrated circuit modeling; Laboratories; Measurement standards; SPICE; Time domain analysis; EMI simulation; ICEM; Instruction Current Model; SW EMI effect;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652076
