Title :
High-frequency oscillations n high-pin-count ECL devices
Author_Institution :
Unisys Corp., San Diego, CA, USA
Abstract :
Examines high-frequency oscillations experimentally observed in high-pin-count ECL ASIC (emitter-coupled-logic application-specific integrated-circuit) devices on high-speed testers. A special test chip was designed to determine experimentally the conditions that create such oscillations. Analytical studies agree closely with the experimental results. Design guidelines are established for the ECL chips and packages to use them, as well as means to eliminate oscillation on the tester. Results confirm that stable operation of the ECL chips can be maintained without speed limitations, as long as certain conditions are met by chip and package designers
Keywords :
circuit oscillations; emitter-coupled logic; integrated circuit testing; logic testing; ASIC; high-frequency oscillations; high-pin-count ECL devices; high-speed testers; package designers; speed limitations; stable operation; Bandwidth; Capacitance measurement; Electronics packaging; Equations; Frequency; Impedance; Sockets; Testing; Transfer functions; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988
Conference_Location :
Rochester, NY
DOI :
10.1109/CICC.1988.20803
