Title :
High-speed InAIAs/InGaAs HBTs on 4-inch S.I. GaAs substrates
Author :
Yakihara, T. ; Oka, S. ; Kobayashi, S. ; Fujita, T. ; Miura, A.
Author_Institution :
Teratec Corp., Tokyo, Japan
Abstract :
In this paper, we describe high-speed InAlAs/InGaAs HBTs on 4-inch S.I. GaAs substrates, which were made with constitutionally graded lattice-buffer layers and optimization of the epitaxial growth temperature. The use of these structures leads to excellent RF characteristics in spite of the thick base (200 nm) and collector (600 nm) of the HBTs. The maximum frequency (fmax) and the current gain cut-off frequency (ft) are 53 GHz and 37 GHz, respectively. We achieved a delay time of 26 ps for an ECL gate, which consists of 130 transistors, 150 resistors, and 10 capacitors on a 4-inch GaAs substrate
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; molecular beam epitaxial growth; 26 ps; 37 GHz; 4 inch; 53 GHz; ECL gate; GaAs; InAlAs-InGaAs; RF characteristics; constitutionally graded lattice-buffer layer; current gain cut-off frequency; delay time; epitaxial growth temperature optimization; high-speed InAIAs/InGaAs HBT; maximum frequency; semi-insulating GaAs substrate; Cutoff frequency; Delay effects; Epitaxial growth; Gallium arsenide; Indium compounds; Indium gallium arsenide; Radio frequency; Resistors; Substrates; Temperature;
Conference_Titel :
Indium Phosphide and Related Materials, 1997., International Conference on
Conference_Location :
Cape Cod, MA
Print_ISBN :
0-7803-3898-7
DOI :
10.1109/ICIPRM.1997.600099