DocumentCode :
311473
Title :
High-speed InAIAs/InGaAs HBTs on 4-inch S.I. GaAs substrates
Author :
Yakihara, T. ; Oka, S. ; Kobayashi, S. ; Fujita, T. ; Miura, A.
Author_Institution :
Teratec Corp., Tokyo, Japan
fYear :
1997
fDate :
11-15 May 1997
Firstpage :
217
Lastpage :
219
Abstract :
In this paper, we describe high-speed InAlAs/InGaAs HBTs on 4-inch S.I. GaAs substrates, which were made with constitutionally graded lattice-buffer layers and optimization of the epitaxial growth temperature. The use of these structures leads to excellent RF characteristics in spite of the thick base (200 nm) and collector (600 nm) of the HBTs. The maximum frequency (fmax) and the current gain cut-off frequency (ft) are 53 GHz and 37 GHz, respectively. We achieved a delay time of 26 ps for an ECL gate, which consists of 130 transistors, 150 resistors, and 10 capacitors on a 4-inch GaAs substrate
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; molecular beam epitaxial growth; 26 ps; 37 GHz; 4 inch; 53 GHz; ECL gate; GaAs; InAlAs-InGaAs; RF characteristics; constitutionally graded lattice-buffer layer; current gain cut-off frequency; delay time; epitaxial growth temperature optimization; high-speed InAIAs/InGaAs HBT; maximum frequency; semi-insulating GaAs substrate; Cutoff frequency; Delay effects; Epitaxial growth; Gallium arsenide; Indium compounds; Indium gallium arsenide; Radio frequency; Resistors; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1997., International Conference on
Conference_Location :
Cape Cod, MA
ISSN :
1092-8669
Print_ISBN :
0-7803-3898-7
Type :
conf
DOI :
10.1109/ICIPRM.1997.600099
Filename :
600099
Link To Document :
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