Title :
Guided model checking with a Bayesian meta-heuristic
Author :
Seppi, Kevin ; Jones, Michael ; Lamborn, Peter
Author_Institution :
Dept. of Comput. Sci., Brigham Young Univ., Provo, UT, USA
Abstract :
This work presents a formal verification algorithm for finding errors in models of complex concurrent systems. The algorithm improves explicit guided model checking by applying the empirical Bayes method to revise heuristic estimates of the distance from a given state to an error state. Guided search using the revised estimates finds errors with less search effort than the original estimates.
Keywords :
Bayes methods; concurrency control; formal verification; search problems; Bayes method; Bayesian metaheuristic; complex concurrent systems; error state; formal verification; guided model checking; guided search; heuristic estimates; Bayesian methods; Computer errors; Computer science; Concurrent computing; Cost function; Formal verification; Protocols; Random variables; State estimation; Statistical analysis;
Conference_Titel :
Application of Concurrency to System Design, 2004. ACSD 2004. Proceedings. Fourth International Conference on
Print_ISBN :
0-7695-2077-4
DOI :
10.1109/CSD.2004.1309134