Title :
Inspection of backlight units with high luminance contrast
Author :
Wei, Tzu-Hsuan ; Tsay, Ho-Lin ; Wen, Jen-Yu ; Chiang, Wei-Chieh ; Huang, Ting-Ming ; Liao, Tai-Shan
Author_Institution :
Instrum. Technol. Res. Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
Abstract :
Two methods to measure the luminance of backlight units with high contrast by a frame CCD camera are proposed. The measurement uncertainties are compared.
Keywords :
CCD image sensors; brightness; measurement uncertainty; backlight unit inspection; frame CCD camera; luminance contrast; measurement uncertainties; Calibration; Charge coupled devices; Charge-coupled image sensors; Inspection; Instruments; Light emitting diodes; Measurement standards; Measurement uncertainty; Testing; Time measurement;
Conference_Titel :
OptoElectronics and Communications Conference, 2009. OECC 2009. 14th
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4102-0
Electronic_ISBN :
978-1-4244-4103-7
DOI :
10.1109/OECC.2009.5214894
