DocumentCode
3114910
Title
Fault detection with little knowledge of system model
Author
Dapeng Ye ; Lin, Paul P.
Author_Institution
Cleveland State Univ., Cleveland, OH
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
1972
Lastpage
1977
Abstract
Observers-based analytical redundancy is a widely used technique for fault detection. There have been many studies on observer-based fault detection, such as using unknown input observer, disturbance observer and generalized observer. Most of them require a nominal mathematical model of the system. This paper presents a new fault detection technique using improved extended state observer (ESO). Based on the input and output data, the ESO specifically identifies the un-modeled dynamics, a feat no other disturbance observer has ever attempted, and it provides vital information for fault diagnosis with only partial information of the plant, which cannot be easily accomplished with any existing methods. Another advantage of ESO is its simplicity in tuning only a single parameter. This parameter is essentially the observer bandwidth, which is a trade-off between the observer´s tracking speed and the observer´s sensitivity to measurement noise. It is shown in this paper that faults can be detected with little knowledge about the system model. A strongly coupled three-tank nonlinear dynamic system is chosen as a case study. The simulation results indicate that the presented ESO-based techniques effectively detected multiple faults.
Keywords
fault diagnosis; modelling; nonlinear dynamical systems; observers; disturbance observer; extended state observer-based fault detection technique; fault diagnosis; mathematical model; measurement noise; system model; three-tank nonlinear dynamic system; Fault detection; Fault diagnosis; Linear systems; Mathematical model; Mechanical engineering; Monitoring; Nonlinear dynamical systems; Observers; State estimation; Uncertainty; Extended state observer; Fault detection; Observer design;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man and Cybernetics, 2008. SMC 2008. IEEE International Conference on
Conference_Location
Singapore
ISSN
1062-922X
Print_ISBN
978-1-4244-2383-5
Electronic_ISBN
1062-922X
Type
conf
DOI
10.1109/ICSMC.2008.4811579
Filename
4811579
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