Title :
Fault coverage of a long random test sequence estimated from a short simulation
Author :
Prepin, Valérie ; David, René
Author_Institution :
Lab. d Autom. de Grenoble, France
fDate :
27 Apr-1 May 1997
Abstract :
Forecasting the fault coverage of a long random test sequence from the results obtained from the simulation of a short test sequence looks like an inaccessible dream. As a matter of fact, a short test sequence detects mainly easy to detect faults, while the test length required for a fault coverage close to 1 depends mainly (almost only) on the most difficult faults. A new 2-parameter model, linking the fault coverage to the test length, was proposed recently. Although these parameters are very difficult to obtain, they can be roughly estimated from a relatively short simulation. According to a previous comment, the results can not be accurate. However, they are more accurate that ones obtained from other models proposed in the literature
Keywords :
circuit analysis computing; fault diagnosis; integrated circuit testing; parameter estimation; sequences; fault coverage estimation; long random test sequence; short simulation; two-parameter model; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Electrical fault detection; Electrical resistance measurement; Fault detection; Joining processes; Length measurement; Predictive models;
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-7810-0
DOI :
10.1109/VTEST.1997.600315