Title :
Defining a measure for the immunity of analogue to digital converters exposed to electric fields
Author :
Aurand, Tobias ; Dawson, John F. ; Robinson, Martin P. ; Marvin, Andrew C.
Author_Institution :
Dept. of Electron., Univ. of York, York
Abstract :
The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both psilaordinarypsila bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.
Keywords :
analogue-digital conversion; digital integrated circuits; error statistics; integrated circuit measurement; radiofrequency interference; IC immunity measurement; RFI; analogue-to digital converters; bit errors; electric fields; histogram shape; radiofrequency interference; Analog-digital conversion; Current measurement; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Frequency; IEC standards; Integrated circuit testing; Interference; Signal analysis; ADC; IEC 62132; Immunity; Statistics; analogue to digital converter;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652111
