DocumentCode :
3115312
Title :
Thermal study of additive multilayer circuitry on polymer and metal substrates
Author :
Ha, Linh ; Matijasevic, Goran ; Gandhi, Pradeep ; Gallagher, Catherine ; Lee, Chin C.
Author_Institution :
Ormet Corp., Carlsbad, CA, USA
fYear :
1998
fDate :
10-12 Mar 1998
Firstpage :
104
Lastpage :
110
Abstract :
A thermal study of an additive technology which is capable of depositing circuit traces directly on a variety of materials, including insulated metal substrates, was performed. These metal printed circuit boards are capable of high thermal dissipation of heat originating from high power components as well as from dense circuitry. The circuit traces are fabricated using electrically conductive composites based on a transient liquid phase sintering (TLPS) technology. The low processing temperature of these composites allows their use with aluminum substrates and with polymer dielectric materials, resulting in multilayer substrate capabilities. An initial investigation of the thermal advantages of this novel technology over conventional copper traces on FR-4 was performed. Finite element analysis was used to compare the two structures. Along with the computer simulation, thermal dissipation was measured using assembled components as well as temperature mapping using emissivity compensated IR imaging. A serpentine pattern was fabricated using a photoimaging technology which is capable of fine lines and spaces. Test structures were made on a variety of substrates including FR-4, Cu-clad FR-4, and Al. Different power levels were applied in the serpentine pattern and thermal imaging showed the heat generated on each of these substrates. The benefit of using an insulated metal substrate with no thermally resistive interfaces is readily apparent from the images. A finite element analysis was also performed and compared with experimental results
Keywords :
cooling; filled polymers; finite element analysis; infrared imaging; packaging; printed circuits; sintering; temperature distribution; thermal analysis; Al; Al substrates; Cu; Cu-clad FR-4 substrates; FR-4 substrates; TLPS technology; additive multilayer circuitry; additive technology; aluminum substrates; assembled components; circuit traces; computer simulation; dense circuitry; direct circuit trace deposition; electrically conductive composites; emissivity compensated IR imaging; fine line/space patterns; finite element analysis; high power components; insulated metal substrate; insulated metal substrates; metal printed circuit boards; metal substrates; multilayer substrate; photoimaging technology; polymer dielectric materials; polymer substrates; processing temperature; serpentine pattern; temperature mapping; thermal dissipation; thermal imaging; thermal study; thermally resistive interfaces; transient liquid phase sintering technology; Additives; Circuits; Dielectric substrates; Finite element methods; Insulation; Nonhomogeneous media; Optical imaging; Polymers; Space technology; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1998. SEMI-THERM Proceedings 1998., Fourteenth Annual IEEE
Conference_Location :
San Diego, CA
ISSN :
1065-2221
Print_ISBN :
0-7803-4486-3
Type :
conf
DOI :
10.1109/STHERM.1998.660394
Filename :
660394
Link To Document :
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